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Binary mutation testing through dynamic translation

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5 Author(s)
Becker, M. ; Fac. of Electr. Eng., Comput. Sci. & Math., Univ. of Paderborn, Paderborn, Germany ; Kuznik, C. ; Joy, M.M. ; Tao Xie
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This paper presents a novel mutation based testing method through binary mutation. For this, a table of mutants is derived by control flow analysis of a disassembled binary under test. Mutations are injected at runtime by dynamic translation. Thus, our approach neither relies on source code nor a certain compiler. As instrumentation is avoided, testing results correspond to the original binary. In addition to high-level language faults, the proposed approach captures target specific faults related to compiling and linking. We investigated the software of an automotive case study. For this, a taxonomy of mutation operators for the ARM instruction set is proposed. Our experimental results prove 100% accuracy w.r.t. confidence metrics provided by conventional testing methods while avoiding significant mutant compilation overhead. Further speed up is achieved by an efficient binary mutation testing framework that relies on extending the open source software emulator QEMU.

Published in:

Dependable Systems and Networks (DSN), 2012 42nd Annual IEEE/IFIP International Conference on

Date of Conference:

25-28 June 2012