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Investigation on Statistical Tools to Analyze Repetitive-Electrostatic-Discharge Endurance of System-Level Protections

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4 Author(s)
Diatta, M.A. ; STMicrolectronics, Tours, France ; Tremouilles, D. ; Bouyssou, E. ; Bafleur, M.

To fulfill the requirement of final-user uncontrolled ESD environment, system-level ESD protection devices must survive repeated ESD stresses. This paper deals with the assessment of ESD protection device reliability toward repetitive stresses using statistical distribution. The proposed method could lead to better ESD robustness improvement than the simplistic “higher ESD robustness” requirement.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:12 ,  Issue: 4 )