This paper presents an ESD-protected V-band (f0 at 58 GHz) low-noise amplifier (LNA) in 65-nm CMOS. Instead of using the conventional diode-based RF ESD design, a high current capability spiral inductor and a high breakdown MOM capacitor are employed as effective bi-directional ESD protection network, and also as part of the input matching by the co-design approach. The measured results demonstrate an over 8-kV HBM ESD protection level with a NF of 5.3 dB and a power gain of 17.5 dB at 58 GHz, under a power consumption of 18 mW. To our best knowledge, this LNA presents a highest ESD protection level and a lowest NF, compared with prior arts in a similar frequency range.
Published in:
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Date of Conference:
17-22 June 2012
- Page(s):
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1
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3
- ISSN :
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0149-645X
- E-ISBN :
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978-1-4673-1086-4
- Print ISBN:
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978-1-4673-1085-7
- Conference Location :
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Montreal, QC, Canada
- Digital Object Identifier :
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10.1109/MWSYM.2012.6259515