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Mechanism of electromigration in ceramic packages induced by chip-coating polyimide

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4 Author(s)
Kohara, M. ; Mitsubishi Electr. Corp., Hyogo, Japan ; Mashiko, Y. ; Nakasaki, K. ; Nunoshita, Masahiro

The mechanism of electromigration between the inner leads of large-scale integrated (LSI) chips in ceramic packages that are coated by thick polyimides to prevent alpha-particle-induced soft errors is discussed. Short-circuit failures between neighboring inner leads in the packages were monitored in the final test after burn-in of LSI devices. The shorting paths between the leads were observed by an optical microscope and scanning electron microscope (SEM). It was found that the path was produced by a deposit between the inner leads. The deposit was found to be composed of electromigration nickel from the inner lead. Also, n-methyl-pyrrolidone (NMP) and water were found in the package by gas analysis. A possible short-circuiting mechanism is discussed

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:13 ,  Issue: 4 )

Date of Publication:

Dec 1990

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