Scheduled System Maintenance:
On May 6th, system maintenance will take place from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). During this time, there may be intermittent impact on performance. We apologize for the inconvenience.
By Topic

Computation of transients in lossy VLSI packaging interconnections

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Liao, J.C. ; Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA ; Palusinski, O.A. ; Prince, J.L.

An efficient method for analyzing the dynamic behavior of lossy electrical interconnects (with frequency-dependent parameters) in very large scale integration (VLSI) systems is presented. The method allows for the inclusion of electrical interconnects which are terminated by networks of lumped passive (R,L,C) and active nonlinear devices such as diodes and bipolar and MOS transistors. The method consists of deriving the circuit model for a transmission line from impulse response data and incorporating this model into an existing computer program called UANTL which performs time-domain analysis for coupled transmission lines with nonlinear termination. Several numerical experiments with this method were performed. Comparisons are made between the results obtained using this method and previously published results

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:13 ,  Issue: 4 )