Close category search window
 

Uncertainty reduction in the volume measurement of Si spheres by an optical interferometer to determine the Avogadro constant

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kuramoto, N. ; Nat. Metrol. Inst. of Japan, Tsukuba, Japan ; Inaba, H. ; Fujii, K.

In the determination of the Avogadro constant using the x-ray crystal density method, volume measurements of Si spheres by optical interferometry play a crucial role. For the accurate volume determination, geometrical shape of the optical components of the interferometer has been evaluated by using ray-tracing method. To reduce the noise in the interference fringes, a new etalon has been developed. An optical frequency comb has been also introduced in the interferometer as the optical frequency standard for more reliable and precise volume measurement. Details of the improvements are described.

Published in:
Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Date of Conference: 1-6 July 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.