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Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors

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5 Author(s)
Min Chen ; Texas Instrum., Dallas, TX, USA ; Reddy, V. ; Krishnan, S. ; Srinivasan, V.
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Asymmetric aging under different workload profiles requires on-chip aging sensors to be sensitive to signal edge degradation. The authors in this paper present a 45-nm on-chip aging sensor that directly monitors circuit performance degradation during dynamic operation.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 5 )

Date of Publication:

Oct. 2012

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