Cart (Loading....) | Create Account
Close category search window
 

On the Noise Optimum of FET Broadband Transimpedance Amplifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sackinger, E. ; Ikanos Commun., Inc., Red Bank, NJ, USA

The optimum sizing of the front-end FET in transimpedance amplifiers (TIA) is revisited. Analytical solutions based on a second-order shunt-feedback TIA model that includes the feedback-resistor noise are derived. It is shown that the optimum FET size can be smaller or larger than suggested by the well-known capacitive matching rule, depending on whether the noise optimization is carried out under a constant gain-bandwidth-product constraint or a constant load-capacitance constraint.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:59 ,  Issue: 12 )

Date of Publication:

Dec. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.