Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Crystallographic Characterization of an Electroplated Zinc Coating Prone to Whiskers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Etienne, A. ; Groupe de Phys. des Mater., Univ. de Rouen, St. Etienne du Rouvray, France ; Cadel, E. ; Lina, A. ; Cretinon, L.
more authors

A Zn-electroplated steel prone to Zn whiskers has been investigated in order to obtain information about the microstructure of the Zn coating at the root of a whisker. Indeed, the characterization of the Zn coating is essential to understand the Zn whisker growth mechanism. Care was taken to prepare a sample at a whisker root by using a focused-ion beam in a dual-beam scanning electron microscope. The sample was analyzed using energy dispersive X-ray spectrometry and electron backscattered diffraction. Results show three different regions: 1) an inclusion enriched with Ca, Al, and C; 2) the Zn coating with columnar grains; and 3) the root of the whisker. An important point is that recrystallized grains are found at the whisker root. This observation supports recent whisker growth models based on recrystallization.

Published in:

Components, Packaging and Manufacturing Technology, IEEE Transactions on  (Volume:2 ,  Issue: 11 )