Cart (Loading....) | Create Account
Close category search window

Improved subspace clustering via exploitation of spatial constraints

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Duc-Son Pham ; Dept. of Comput., Curtin Univ., Perth, WA, Australia ; Budhaditya, S. ; Phung, D. ; Venkatesh, S.

We present a novel approach to improving subspace clustering by exploiting the spatial constraints. The new method encourages the sparse solution to be consistent with the spatial geometry of the tracked points, by embedding weights into the sparse formulation. By doing so, we are able to correct sparse representations in a principled manner without introducing much additional computational cost. We discuss alternative ways to treat the missing and corrupted data using the latest theory in robust lasso regression and suggest numerical algorithms so solve the proposed formulation. The experiments on the benchmark Johns Hopkins 155 dataset demonstrate that exploiting spatial constraints significantly improves motion segmentation.

Published in:

Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on

Date of Conference:

16-21 June 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.