Cart (Loading....) | Create Account
Close category search window

A new hybrid metric map representation by using Voronoi diagram and its application to SLAM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Shuai Guo ; State Key Lab. of Robot., Shenyang Inst. of Autom., Shenyang, China ; Shugen Ma ; Bin Li ; Minghui Wang
more authors

In this paper we present a hybrid metric map representation, which partitions the global map space into a series of local subregions by operating Voronoi diagram on global feature map and builds a local dense map in each subregion. Compared with the existing hybrid metric map representation [1] [2] (HYMM), this new hybrid metric map representation has the following advantages: First, the Voronoi diagram ensures that the map partition result is unique. Second, the local environment contour in each subregion is proven to be described completely by its corresponding local map. Third, benefited from the presented hybrid metric map representation, a shape matching data association (DA) method is presented to deal with the ambiguity problem of traditional DA approaches. An experiment carried out in a corridor environment validates the effectiveness of the new hybrid metric map representation and the shape matching DA method.

Published in:

Information and Automation (ICIA), 2012 International Conference on

Date of Conference:

6-8 June 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.