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This paper reviews some of the many published technical papers relating to the measurement of IC emissions using a 1 GHz TEM cell or GTEM cell modified to accept an IC test board and provides a basis for correlation between these IC level measurements and module level RF emissions. We will follow the development of this methodology from the early investigations through the later applications to show the viability of the technique for IC qualification. Developments over time have shown that this method of IC emission measurement is repeatable, correlatable to other methods and provides, within limits, useful prediction of module level RF emissions performance.
Date of Publication: First Quarter 2012