By Topic

EMI filter design: Part II: Measurement of noise source impedances

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Vuttipon Tarateeraseth ; Department of Electrical Engineering, Srinakharinwirot University, Thailand

In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differential mode equivalent noise source impedances of a SMPS under it actual operating conditions.

Published in:

IEEE Electromagnetic Compatibility Magazine  (Volume:1 ,  Issue: 1 )