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This book is a collection of chapters from different authors on the state of the art in transistor model parameter extraction. It tackles the real gnarly problems such as thermal effects, parameter dispersion from traps and heating, how to cope with large transistors, and how to practically compute process variations. Includes a discussion of both bipolar and field effect transistors (FETs). Also contains chapters on the basics of extrinsic parameters, noise, and uncertainty. Contains ten chapters and, given all the ground it covers, is a relatively compact 366 pages.