Scheduled Maintenance on April 29th, 2016:
IEEE Xplore will be unavailable for approximately 1 hour starting at 11:30 AM EDT. We apologize for the inconvenience.
By Topic

New Absorbing Boundary Conditions and Analytical Model for Multilayered Mushroom-Type Metamaterials: Applications to Wideband Absorbers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Yashwanth R. Padooru ; Department of Electrical Engineering, The University of Mississippi, University, MS, USA ; Alexander B. Yakovlev ; Chandra S. R. Kaipa ; George W. Hanson
more authors

An analytical model is presented for the analysis of multilayer wire media loaded with 2-D arrays of thin material terminations, characterized in general by a complex surface conductivity. This includes the cases of resistive, thin metal, or graphene patches and impedance ground planes. The model is based on the nonlocal homogenization of the wire media with additional boundary conditions (ABCs) at the connection of thin (resistive) material. Based on charge conservation, new ABCs are derived for the interface of two uniaxial wire mediums with thin imperfect conductors at the junction. To illustrate the application of the analytical model and to validate the new ABCs, we characterize the reflection properties of multilayer absorbing structures. It is shown that in such configurations the presence of vias results in the enhancement of the absorption bandwidth and an improvement in the absorptivity performance for increasing angles of an obliquely incident TM-polarized plane wave. The results obtained using the analytical model are validated against full-wave numerical simulations.

Published in:

IEEE Transactions on Antennas and Propagation  (Volume:60 ,  Issue: 12 )