By Topic

30-kV spin-polarized transmission electron microscope with GaAs–GaAsP strained superlattice photocathode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Kuwahara, M. ; EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan ; Kusunoki, S. ; Jin, X.G. ; Nakanishi, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A spin-polarized electron beam has been used as the probe beam in a transmission electron microscope by using a photocathode electron gun with a photocathode made of a GaAs–GaAsP strained superlattice semiconductor with a negative electron affinity (NEA) surface. This system had a spatial resolution of the order of 1 nm for at 30 keV and it can generate an electron beam with an energy width of 0.24 eV without employing monochromators. This narrow width suggests that a NEA photocathode can realize a high energy resolution in electron energy-loss spectroscopy and a longitudinal coherence of 3 × 10-7 m.

Published in:

Applied Physics Letters  (Volume:101 ,  Issue: 3 )