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30-kV spin-polarized transmission electron microscope with GaAs–GaAsP strained superlattice photocathode

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9 Author(s)
Kuwahara, M. ; EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan ; Kusunoki, S. ; Jin, X.G. ; Nakanishi, T.
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A spin-polarized electron beam has been used as the probe beam in a transmission electron microscope by using a photocathode electron gun with a photocathode made of a GaAs–GaAsP strained superlattice semiconductor with a negative electron affinity (NEA) surface. This system had a spatial resolution of the order of 1 nm for at 30 keV and it can generate an electron beam with an energy width of 0.24 eV without employing monochromators. This narrow width suggests that a NEA photocathode can realize a high energy resolution in electron energy-loss spectroscopy and a longitudinal coherence of 3 × 10-7 m.

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Applied Physics Letters  (Volume:101 ,  Issue: 3 )