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Surface enhanced Raman scattering and localized surface plasmon resonance of nanoscale ultrathin films prepared by atomic layer deposition

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5 Author(s)
Chih Lin, Ming ; Department of Materials Science and Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan ; Nien, Li-Wei ; Chen, Ching-Hsiang ; Lee, Chia-Wei
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An approach was proposed to characterize nanoscale ultrathin films using surface enhanced Raman scattering (SERS). Raman spectroscopy of the TiO2 film as thin as ∼2 nm, which was prepared by atomic layer deposition, was obtained by depositing a nanostructured Au layer on the film surface. Red-shift in the extinction spectrum of the nanostructured Au layer was observed with increasing TiO2 film thickness, ascribed to the increase in effective refractive index of the substrate slab and coupled plasmon resonance. This SERS technique can be applied to investigate a variety of solid-state ultrathin films in nanosclae materials and devices in future studies.

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Applied Physics Letters  (Volume:101 ,  Issue: 2 )