Cart (Loading....) | Create Account
Close category search window

Voltage harmonic distortion measurement issue in smart-grid distribution system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Luszcz, J. ; Fac. of Electr. & Control Eng., Gdansk Univ. of Technol., Gdansk, Poland ; Smolenski, R.

This paper presents the investigation results of voltage harmonic transfer accuracy problems through voltage transformers which are widely used in power quality monitoring systems in medium and high voltage grids. A simplified lumped parameters circuit model of the voltage transformer is presented and verified by simulation and experimental investigations. A number voltage transformers typically used in medium voltage grid has been tested in the conducted electromagnetic interference frequency range up to 30 MHz. The obtained results confirm that broadband voltage transfer function of the voltage transformer usually exhibits various irregularities which are primarily associated with voltage transformer winding parasitic capacitances.

Published in:

Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on

Date of Conference:

21-24 May 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.