Cart (Loading....) | Create Account
Close category search window
 

Planar material sample fixture characterization and application for EMI shielding effectiveness evaluations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yueyan Shan ; Nat. Metrol. Centre (NMC), A*STAR, Singapore, Singapore ; Ping Li ; Junhong Deng

Various materials for shielding against electromagnetic radiation have been rapidly developed to protect the operational environment and prevent interference. Reliable measurement is required to determine and evaluate the material properties. In this paper, the characterization methods for planar material sample fixtures are first presented in both the time domain using oscilloscope time domain reflectometry (TDR) and vector network analyser TDR methods, and the frequency domain using a vector network analyser (VNA). Then the application of the characterised planar material sample fixtures are described for the measurement of EMI shielding effectiveness of carbon nanotubes based coatings.

Published in:

Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on

Date of Conference:

21-24 May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.