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Electro-explosive devices (EEDs) are very commonly used in the Aerospace and ordnance system for variety of purposes. These EEDs are operated by long shielded cables which are often run along with the other power and signal cables. During the switching on and off operations of various circuits large transients may be coupled to EEDs through cables with sharp rise and fall time. This paper investigates the effects of such transient on the instrumented EEDs (MK1 Squib) by measuring the average induced current due to CS115 test. The CS115 test as per MIL-STD-461 E simulates the transient's environments during switching operations on various platforms due to external transient environments such as Electromagnetic pulses, lightning in conducted form.