Cart (Loading....) | Create Account
Close category search window
 

The Wide Area Grid Testbed for Flood Monitoring Using Earth Observation Data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

In this paper we present the results of the Wide Area Grid (WAG) project that was carried out within the Working Group on Information Systems and Services (WGISS) of the Committee on Earth Observation Satellites (CEOS). We describe the InterGrid infrastructure that integrates several regional and national Grid systems: Ukrainian Academician Grid (with satellite data processing Grid segment, UASpaceGrid) and Grid system at the Center on Earth Observation and Digital Earth of Chinese Academy of Sciences (CEODE-CAS). The study also focuses on workflow automation and management in Grid environment, and provides an example of workflow automation for generating flood maps from satellite imagery. Examples of utilizing the developed infrastructure for operational flood mapping are given as well.

Published in:

Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of  (Volume:5 ,  Issue: 6 )

Date of Publication:

Dec. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.