Cart (Loading....) | Create Account
Close category search window
 

Measurement of Complex Permittivity of Cylindrical Objects in the E-Plane of a Rectangular Waveguide

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Akhtar, M.J. ; Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India ; Thumm, M.

Remote sensing of dielectric properties is used for numerous applications such as the field evaluation of soil water, salinity, or the organic matter content. The objective of this study is to measure dielectric properties of cylindrical shaped samples for the previously specified applications. The proposed method employs an analytical approach for determining the complex permittivity of cylindrical dielectric objects placed in the E-plane of a rectangular waveguide. The overall procedure is based on the measurement of reflection and transmission coefficients of the test specimen by placing it inside a section of rectangular waveguide. The reconstruction of dielectric properties of the test sample from the measured scattering coefficients is carried out using the newly proposed closed-form expressions, which are derived by transforming the actual circular cross section of the cylindrical sample into the equivalent multilayered rectangular cross sections. The dielectric properties of a number of specimens, including typical plastics and vegetation samples, are determined using the proposed approach. The typical error in the reconstruction of the dielectric constant of these samples having moderate permittivity values is found to be less than 5%.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:51 ,  Issue: 1 )

Date of Publication:

Jan. 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.