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Scattering by Anisotropic Rough Layered 2D Interfaces

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2 Author(s)
Saddek Afifi ; Laboratoire de Physique des Lasers, de Spectroscopie Optique et d'Opto-électronique (LAPLASO), Badji Mokhtar-Annaba University, Annaba, Algeria ; Richard Dusseaux

We propose a statistical study of the scattering of an incident plane wave by a stack of two two-dimensional rough interfaces. The interfaces are characterized by Gaussian height distributions with zero mean values and Gaussian correlation functions. The electromagnetic fields are represented by Rayleigh expansions, and a perturbation method is used for solving the boundary value problem and determining the first-order scattering amplitudes. For slightly rough interfaces with a finite extension, we show that the modulus of the co- and cross-polarized scattering amplitudes follows a Hoyt law and that the phase is not uniformly distributed. For interfaces with an infinite extension, the modulus follows a Rayleigh law and the phase is uniformly distributed. We show that these results are true for correlated or uncorrelated interfaces and for isotropic or anisotropic interfaces.

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IEEE Transactions on Antennas and Propagation  (Volume:60 ,  Issue: 11 )