Referenced Items are not available for this document.
In this letter, a drain current noise model that includes the channel thermal noise and the shot noise generated at the source-bulk junction and the drain-bulk junction is presented. A unified analytical expression is derived to ensure excellent continuity with smooth transition of drain current noise from weak- to strong-inversion regimes, including the moderate-inversion region. Excellent agreement between simulated and extracted noise data has shown that the proposed model is accurate over different dimensions and operating conditions.
Published in:
Electron Device Letters, IEEE
(Volume:33
,
Issue:
8
)
Date of Publication: Aug. 2012
- Page(s):
- 1117 - 1119
- ISSN :
- 0741-3106
- INSPEC Accession Number:
- 12879336
- Digital Object Identifier :
- 10.1109/LED.2012.2203781
- Product Type:
- Journals & Magazines
- Date of Publication :
- 10 July 2012
- Date of Current Version :
- 20 July 2012
- Issue Date :
- Aug. 2012
- Sponsored by :
- IEEE Electron Devices Society
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