Cart (Loading....) | Create Account
Close category search window
 

Electric field analysis at the triple junction of a optimum profile disc type spacer in SF6 gas insulated system with abnormalities under DC voltages

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chowdary, D.D. ; Dr. L. Bullayya Coll. of Eng. for Women, Visakhapatnam, India ; Amarnath, J.

In Gas Insulated Systems the breakdown strength of SF6 gas is badly affected by locally enhanced electric fields due to protrusions and delamination. Metal insert electrodes, which are used in GIS, reduces stresses near the triple junctions with simultaneous rise in the stresses elsewhere along spacer surface. AC-GIS are in operation for a long time but there is a limited knowledge for DC application. In the case of DC-GIS, charges invariably accumulate over a period of time along the spacer surface. The electric field distribution around solid spacer is greatly altered by the accumulated surface charges. In this work, the electric field distribution with DC as applied voltage is studied at the triple junction for a cone type spacer with and without metal insert along with the effect of delamination and protrusions on the surface of the insulator. Finite Element Method (FEM), one of the proven numerical method, is used for computing the electric fields at various points under consideration.

Published in:

Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on

Date of Conference:

16-19 Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.