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A physical model for the frequency-dependent dielectric response of multilayered structures is reported. Two frequency regimes defined by the relative permittivities and volume resistivities of the layers have been analytically identified and experimentally investigated on a structure consisting of polyimide and poly(vinilydenefluoride) layers. The relative permittivity follows an effective medium model at high frequency while showing a dependence on the volume resistivity at low frequency. In this regime, relative permittivities exceeding those expected from effective medium model are recorded. These findings provide insights into inhomogeneous dielectrics behavior for the development of high energy density dielectric films.