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Study of multiple layer dielectric loaded elliptical ridge waveguide by edge finite element method

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3 Author(s)
Guojian Li ; Sch. of Electr. Eng., Northwest Univ. for Nat., Lanzhou, China ; Aning Ma ; Yinqin Cheng

A new kind of multiple layer dielectric loaded elliptical ridge waveguide is presented in this paper. Variations of the cutoff wavelength and single-mode bandwidth with the ridge dimensions for different values of dielectric constant have been investigated in detail by using edge element method. The field patterns of the waveguide also have been presented. The results will be of practical significance in designing ridge waveguide components in microwave and millimeter wave engineering.

Published in:
Microwave and Millimeter Wave Technology (ICMMT), 2012 International Conference on  (Volume:3 )

Date of Conference: 5-8 May 2012

Page(s):
1 - 3
Print ISBN:
978-1-4673-2184-6
INSPEC Accession Number:
12849898
Conference Location :
Shenzhen
Digital Object Identifier :
10.1109/ICMMT.2012.6230133
Product Type:
Conference Publications

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