Close category search window
 

Linewidth measurements and phase locking of Josephson oscillators using RSFQ circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dubash, N.B. ; Conductus Inc., Sunnyvale, CA, USA ; Yongming Zhang ; Ghoshal, U. ; Perng-Fei Yuh

We present a technique for linewidth measurement and phase-locking of Josephson oscillators using digital rapid single-flux-quantum (RSFQ) circuits. The oscillator consists of a resistively shunted 6 /spl mu/m/spl times/6 /spl mu/m Nb/AlO/sub x//Nb Josephson tunnel junction that is integrated with RSFQ input and output circuits. A cascade of RSFQ T flip-flops is used to directly monitor the output of the Josephson oscillator. Spectral characteristics have been measured directly for oscillator frequencies ranging from 10-50 GHz. The linewidth can be reduced by over 100 times by phase-locking the oscillator to an RSFQ pulse train generated by an external sinusoidal signal. These Josephson oscillators can be used as on-chip stable high frequency clocks for RSFQ circuits.

Published in:
Applied Superconductivity, IEEE Transactions on  (Volume:7 ,  Issue: 3 )

Date of Publication: Sept. 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.