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Reverse-recovery safe operating area of diodes in power integrated circuits

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4 Author(s)
Hower, P. ; Texas Instrum., Manchester, NH, USA ; Kaya, Cetin ; Pendharkar, S. ; Jones, C.

Failure during reverse recovery of an IC power diode is examined. It is shown how one-dimensional diode behavior together with mixed-mode tcad can be used to predict safe operating conditions for the actual two-dimensional case.

Published in:

Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on

Date of Conference:

3-7 June 2012