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Reverse-recovery safe operating area of diodes in power integrated circuits

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4 Author(s)
Phil Hower ; Texas Instruments, Manchester, NH, USA ; Cetin Kaya ; Sameer Pendharkar ; Clif Jones

Failure during reverse recovery of an IC power diode is examined. It is shown how one-dimensional diode behavior together with mixed-mode tcad can be used to predict safe operating conditions for the actual two-dimensional case.

Published in:

2012 24th International Symposium on Power Semiconductor Devices and ICs

Date of Conference:

3-7 June 2012