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In this paper we focus on test case generation for large database applications in the telecommunication industry domain. In particular, we present an approach that is based on the Category Partition Method and uses the SMT solver Z3 for automatically generating input test data values for the obtained test cases. For the generation process, we make use of different test case generation strategies. First initial results show that the one based on genetic programming delivers the fewest number of test cases while retaining choice coverage. Moreover, the obtained results indicate that the presented approach is feasible for the intended application domain.