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Intentional overstress trimming of active semiconductor devices

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2 Author(s)
D. W. Hughes ; Georgia Inst. of Technol., Atlanta, GA, USA ; R. K. Feeney

An alternative methodology for adjusting the performance of electronic systems to ensure that they are operating according to the required specifications is described. Intentional electrical overstress is employed to systematically adjust the performance of integrated devices and circuits. It is shown that such an approach can trim selected circuits even after they have been assembled into packages. The trimming approach discussed is based upon the introduction of systematic and repeatable changes in transistor parameters by energetic pulses applied between appropriate terminals of the device. A preliminary reliability assessment of the technique has been performed, and the available results are discussed

Published in:

IEEE Transactions on Electron Devices  (Volume:37 ,  Issue: 11 )