Close category search window
 

A 2D-to-3D Image Conversion System Using Block Slope Pattern Based Vanishing Point Detection Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yu-Cheng Fan ; Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan ; Po-Wei Chen ; Yi-Chih Chiu

In this paper, we propose a method of depth map restructure. Firstly, we analyze the Two-Dimensional (2D) image by block based method. In the analyze process, using the slope pattern to identify the line segments slope of the block. And secondly, we detect the vanishing point, which is the farthest location in the image, by the line segments. Finally, we can restructure the depth map by the vanishing point location. Our method can avoid high computational complexity and it's very suited in chip design.

Published in:
Computer, Consumer and Control (IS3C), 2012 International Symposium on

Date of Conference: 4-6 June 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.