Cart (Loading....) | Create Account
Close category search window

Resolution Analysis of N -Ocular Imaging Systems With Tilted Image Sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Donghak Shin ; Electr. & Comput. Eng. Dept., Univ. of Connecticut, Storrs, CT, USA ; Javidi, B.

In this paper, we present an N-ocular imaging system with tilted image sensors to improve the depth resolution for objects under fixed system resource constraints. A nonplanar arrangement of image sensors enables one to improve the system performance due to the increase in the common field of view (FOV). We analyze the depth resolution based on the two point sources resolution criterion as a function of sensing parameters such as the number of cameras, the number of pixels, parallax, pixel size, and focal length. We carry out Monte Carlo simulations in the analysis. The results indicate that the proposed method may improve the common FOV zone and thus provide improved depth resolution for N -ocular imaging system when the objects are not very far from the sensors.

Published in:

Display Technology, Journal of  (Volume:8 ,  Issue: 9 )

Date of Publication:

Sept. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.