Cart (Loading....) | Create Account
Close category search window
 

Coverage Estimation in Model Checking with Bitstate Hashing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ikeda, Satoshi ; NEC Corporation, Kawasaki ; Jibiki, Masahiro ; Kuno, Yasushi

Explicit-state model checking which is conducted by state space search has difficulty in exploring satisfactory state space because of its memory requirements. Though bitstate hashing achieves memory efficiency, it cannot guarantee complete verification. Thus, it is desirable to provide a reliability indicator such as a coverage estimate. However, the existing approaches for coverage estimation are not very accurate when a verification run covers a small portion of state space. This mainly stems from the lack of information that reflects characteristics of models. Therefore, we propose coverage estimation methods using a growth curve that approximates an increase in reached states by enlarging a bloom filter. Our approaches improve estimation accuracy by leveraging the statistics from multiple verification runs. Coverage is estimated by fitting the growth curve to these statistics. Experimental results confirm the validity of the proposed growth curve and the applicability of our approaches to practical models. In fact, for practical models, our approaches outperformed the conventional ones when the actual coverage is relatively low.

Published in:

Software Engineering, IEEE Transactions on  (Volume:39 ,  Issue: 4 )

Date of Publication:

April 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.