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Reliable tantalum-gate fully-depleted-SOI MOSFET technology featuring low-temperature processing

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6 Author(s)
Ushiki, T. ; Tohoku Univ., Sendai, Japan ; Mo-Chiun Yu ; Hirano, Y. ; Shimada, H.
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A reliable tantalum (Ta)-gate device technology, which can drastically reduce the number of process steps, has been developed. Ta-gate fully-depleted-silicon-on-insulator (FDSOI) MOSFETs with 0.15-μm gate length by low-temperature processing below 500°C after the gate oxide formation have good on/off characteristics. Comprehensive design guidelines for Ta-gate MOSFETs in the deep-submicrometer regime is provided by investigating a wide range of performance and reliability constraints on the process temperature and the SOI thickness. In the guideline, the recrystallization of the source/drain region gives inferior limits of the SOI thickness and the process temperature. Thermal reaction between Ta and SiO2 films sets a superior limit of the process temperature, and a short-channel effect sets a superior limit of the SOI thickness

Published in:

Electron Devices, IEEE Transactions on  (Volume:44 ,  Issue: 9 )

Date of Publication:

Sep 1997

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