Cart (Loading....) | Create Account
Close category search window
 

Noise and fluctuations in submicrometric Al-Si interconnect lines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Neri, B. ; Dipartimento di Ingegneria dell''Inf. Elettronica, Pisa Univ., Italy ; Ciofi, C. ; Dattilo, V.

Low-frequency noise (LFN) in excess has been observed in the past in metal lines subjected to high current densities. Different types of noise and fluctuations have been identified and are briefly summarized in the first part of this paper. Then, some new experimental results, obtained with Al/Si submicrometric lines, are presented. In particular, it has been possible to identify and separate the contribution of three different sources of noise and, from the analysis of the noise component directly related to electromigration, an activation energy of about 1.4 eV has been obtained. This value clearly indicates that in these samples bulk electromigration is the main cause of the noise generation. Moreover, the consistency between the measured level of noise and the value of some physical quantities, contained in a model previously proposed, has been verified. In the final section of the paper, old and new results are utilized in an attempt to provide a satisfactory answer to some of the most important unsolved questions in this field

Published in:

Electron Devices, IEEE Transactions on  (Volume:44 ,  Issue: 9 )

Date of Publication:

Sep 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.