By Topic

Experimental Observation of Current-Induced Bistability in a Semiconductor Laser With Positive Optoelectronic Feedback

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Yi-Yuan Xie ; Sch. of Phys., Southwest Univ., Chongqing, China ; Xiao-Dong Lin ; Tao Deng ; Wu, Zheng-mao
more authors

Bistability in a single-mode distributed feedback semiconductor laser (DFB-SL) with positive optoelectronic feedback (POEF) is observed experimentally. For a given biased current, the output dynamical states of DFB-SL with POEF are critically dependent on variation routes of the laser-biased current. Different routes of biased current variation lead to a bistability characterized by states of different time series, power spectra, and phase portraits.

Published in:

Photonics Technology Letters, IEEE  (Volume:24 ,  Issue: 16 )