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A rapid defect detecting algorithm for printed matter on the assembly line

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2 Author(s)
Ximing Yang ; Sch. of Comput. Sci., Yantai Univ., Yantai, China ; Shuanhu Wu

To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.

Published in:

Systems and Informatics (ICSAI), 2012 International Conference on

Date of Conference:

19-20 May 2012