Close category search window
 

Superimposed training based doubly selective channel estimation for OFDM modulated amplify-and-forward relay networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Han Zhang ; Dept. of Phys. & Telecommun., South China Normal Univ., Guangzhou, China ; Daru Pan ; Haixia Cui ; Feifei Gao
more authors

This paper is concerned with the problem of superimposed training based channel estimation for orthogonal frequency division multiplexing (OFDM) modulated amplify-and-forward (AF) relay networks in doubly selective environment. A `subblockwise' linear assumption based channel model is proposed to represent the mobile-to-mobile doubly selective channels. We then propose novel strategy that allows the destination node to separately obtain the channel information of the source to relay link and the relay to destination link, from which the optimal ST signals are derived by minimizing the channel mean-square-error. Extensive numerical results are provided to corroborate the proposed studies.

Published in:
Systems and Informatics (ICSAI), 2012 International Conference on

Date of Conference: 19-20 May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.