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In this contribution a novel stochastic Galerkin method is proposed to analyze the parameter variability of uniform on-chip interconnects. This efficient and accurate stochastic modeling method is made possible, specifically for on-chip interconnects, by first constructing parameterized macromodels of the per unit length transmission line parameters. The theory is illustrated by means of a numerical example, i.e. an inverted embedded microstrip line, of which the variability is analyzed in both the frequency and the time domain. A comparison with a standard Monte Carlo technique validates the new approach.
Date of Conference: 13-16 May 2012