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Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

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9 Author(s)
Taylor, C.N. ; School of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907, USA ; Heim, B. ; Gonderman, S. ; Allain, J.P.
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The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPP's XPS and TDS capabilities.

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Review of Scientific Instruments  (Volume:83 ,  Issue: 10 )