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A Highly Fault-Efficient SAT-Based ATPG Flow

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2 Author(s)
Stephan Eggersglub ; German Research Center for Artificial Intelligence (DFKI), Bremen, Germany ; Rolf Drechsler

ATPG based on Boolean Satisfiability (SAT) could be a promising alternative to structural test generation algorithms. This article proposes a SAT-based ATPG flow for generating high quality test patterns while applicable to large industry designs.

Published in:

IEEE Design & Test of Computers  (Volume:29 ,  Issue: 4 )