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A 20-b \pm 40-mV Range Read-Out IC With 50-nV Offset and 0.04% Gain Error for Bridge Transducers

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4 Author(s)
Rong Wu ; Analog Devices, Wilmington, MA, USA ; Youngcheol Chae ; Huijsing, J.H. ; Makinwa, K.A.A.

This paper presents a 20-b read-out IC with ±40-mV full-scale range that is intended for use with bridge transducers. It consists of a current-feedback instrumentation amplifier (CFIA) followed by a switched-capacitor incremental ΔΣ ADC. The CFIA's offset and 1/f noise are mitigated by chopping, while its gain accuracy and gain drift are improved by applying dynamic element matching to its input and feedback transconductors. Their mismatch is reduced by a digitally assisted correction loop, which further reduces the CFIA's gain drift. Finally, bulk-biasing and impedance-balancing techniques are used to reduce the common-mode dependency of these transconductors, which would otherwise limit the achievable gain accuracy. The combination of these techniques enables the read-out IC to achieve 140-dB CMRR, a worst-case gain error of 0.04% over a 0-2.5 V common-mode range, a maximum gain drift of 0.7 ppm/°C and an INL of 5 ppm. After applying nested-chopping, the read-out IC achieves 50-nV offset, 6-nV/°C offset drift, a thermal noise floor of 16.2 nV/√Hz and a 0.1-mHz 1/f noise corner. Implemented in a 0.7-μm CMOS technology, the prototype read-out IC consumes 270 μA from a 5-V supply.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:47 ,  Issue: 9 )

Date of Publication:

Sept. 2012

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