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Characterization of Edgeless CdTe Detectors for use in Hard X-Ray Imaging Applications

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11 Author(s)
Veale, Matthew C. ; STFC Rutherford Appleton Laboratory, Chilton, UK ; Bell, S.J. ; Jones, L.L. ; Seller, Paul
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Segmentation of the anode-side of a {\rm M}mathchar CdTe diode produces detectors with excellent spatial and energy resolution while maintaining an active area that extends to the detector edge. The CdTe pixel detectors reported have 250 ìm pitch, a detector thicknesses of 1 mm and are bonded to a spectroscopic readout ASIC. The results from an edgeless {\rm M}mathchar CdTe detector with indium-diffused anodes, produced via diamond blade segmentation, are compared to those of a CdTe Schottky pixel detector with aluminium anodes and guard band produced using standard photolithographic techniques. The energy resolution at 59.54 keV was measured to be 1.4% and 1.3% for the standard and edgeless detector respectively. The spectroscopic performance of pixels located at the detector edges are discussed with reference to TCAD simulations and X-ray micro-beam measurements.

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Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 4 )