Cart (Loading....) | Create Account
Close category search window
 

Knowledge verification with an enhanced high-level Petri-Net model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chih-Hung Wu ; Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan ; Shie-Jue Lee

We describe how to model rule-based systems using advanced Petri-net models in which variables and negation are exactly represented. We also explain how such models achieve knowledge verification. We explore the detection of improper knowledge, including redundancy, subsumption, conflicts, cycles, and unnecessary conditions, through reachability problems solved using an enhanced high-level Petri-net (Ehlpn) model. We assume that each rule describes an implication relation from a collection of conditions (left-hand side) to a collection of actions or conclusions (right hand side). Negative elements may appear in both the left- and right-hand sides. For convenience, we represent a variable in a rule by a string beginning with an uppercase letter, and a constant by a string beginning with a lowercase letter

Published in:

IEEE Expert  (Volume:12 ,  Issue: 5 )

Date of Publication:

Sep/Oct 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.