Cart (Loading....) | Create Account
Close category search window

Re-use of IEC 61131-3 Structured Text for IEC 61499

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wenger, M. ; Autom. & Control Inst., Vienna Univ. of Technol., Vienna, Austria ; Zoitl, A.

Because of the wide industrial adoption of IEC 61131-3 there exist a large amount of libraries and know-how, much of it in ST. Reusing these for IEC 61499 can greatly reduce the cost for changing to the new paradigm and allows to leverage existing investments. In this work we investigate how such a re-use can be performed. We develop a concept for IEC 61499 FBs encapsulating existing ST based IEC 61131-3 FBs and functions. Furthermore we develop transformation and design guidelines for using existing ST FBs and functions inside of IEC 61499. This not only improves an automatic transformation of IEC 61131-3 to IEC 61499 but also provides valuable input for IEC 61499 application developers as well as for the standardization committee to improve and extend IEC 61499.

Published in:

Industrial Technology (ICIT), 2012 IEEE International Conference on

Date of Conference:

19-21 March 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.