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Thickness dependence of magneto-optical effects in (Ga,Mn)As epitaxial layers

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5 Author(s)
Al-Qadi, B. ; Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259-R2-57 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan ; Nishizawa, N. ; Nishibayashi, K. ; Kaneko, M.
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Rotation angle (θMO) of a linearly polarized light reflected from in-plane, ferromagnetic (Ga,Mn)As layers was measured precisely using a magneto-optical microscope. The θMO value varies non-linearly as a function of (Ga,Mn)As layer thickness d, showing a maximum at d = 50–60 nm. The thickness dependent θMO was analyzed quantitatively with a model based on an interference effect incorporating birefringence and dichroism, and it has been concluded that the contribution of magnetization-vector dependent refractive index, a magnetic birefringence, is responsible for the observed magneto-optical effect. The magnitude of magnetic birefringence appears to be comparable to those of uniaxial birefringence crystals.

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Applied Physics Letters  (Volume:100 ,  Issue: 22 )