By Topic

Anomalous length scaling of carbon nanotube-metal contact resistance: An ab initio study

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kim, Yong-Hoon ; Graduate School of EEWS and KI for NanoCentury, Korea Advanced Institute of Science and Technology, Daejeon 305-701, South Korea ; Sung Kim, Hu

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4721487 

Employing open-ended carbon nanotubes (CNTs) with and without hydrogen termination, we study the length scaling of metal-CNT contact resistance and its correlation with chemical bonding from first principles. Both models similarly show a transition from the fast-growing short-length scaling to the slow-growing long-length scaling. However, while the hydrogenated CNTs have much lower short-length resistances than H-free CNTs, Schottky barrier of the former is almost twice thicker and its eventual long-length-limit resistance becomes significantly higher. This demonstrates the critical role of atomistic details in metal-CNT contacts and localized CNT edge states for the Schottky barrier shape and metal-induced gap states.

Published in:

Applied Physics Letters  (Volume:100 ,  Issue: 21 )