Cart (Loading....) | Create Account
Close category search window
 

Expurgated PPM Using Symmetric Balanced Incomplete Block Designs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Noshad, Mohammad ; Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA ; Brandt-Pearce, M.

In this letter, we propose a new pulse position modulation (PPM) scheme, called expurgated PPM (EPPM), for application in peak power limited communication systems, such as impulse radio (IR) ultra wide band (UWB) systems and free space optical (FSO) communications. Using the proposed scheme, the constellation size and the bit-rate can be increased significantly in these systems. The symbols are obtained using symmetric balanced incomplete block designs (BIBD), forming a set of pair-wise equidistant symbols. The performance of Q-ary EPPM is better than any Q-ary pulse position-based modulation scheme with the same symbol length. Since the code is cyclic, the receiver for EPPM is simpler compared to multipulse PPM (MPPM).

Published in:

Communications Letters, IEEE  (Volume:16 ,  Issue: 7 )

Date of Publication:

July 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.