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Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors

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6 Author(s)
Wu, J.F. ; Sch. of Electron. Sci. & Eng., NUDT, Changsha, China ; Sicard, E. ; Boyer, A. ; Ben Dhia, S.
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Presented is a new test method that consists in monitoring on-chip internal voltages during susceptibility tests of integrated circuits. An on-chip sensor was installed at several internal nodes within low-dropout regulators to measure the distortion of internal signals induced by the coupling of electromagnetic interference. The comparison between external and internal measurement results shows that on-chip sensor techniques enhance the extraction of circuit susceptibility levels, especially at high frequencies.

Published in:

Electronics Letters  (Volume:48 ,  Issue: 11 )

Date of Publication:

May 24 2012

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